Leica EM TXP Target Surfacing System
GT Vision
Price not listed
Introducing the Leica EM TXP target preparation instrument. Designed for preparing samples prior to examination by SEM, TEM and light microscopy techniques, the EM TXP mills, saws, grinds and polishes the samples. The Leica EM TXP Microscope includes an integrated stereomicroscope, aiding identification and preparation of barely visible targets. Applications: SEM sample preparation TEM sample preparation Light microscopy sample preparation Shipping: Shipping is by courier and takes typically 17-21 days but this can alter so please phone us on +44 (0)1284 789697 or email us for current delivery
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Buy from GT VISION LTDGT VISION LTD is a UK retailer, not the maker. Price seen 2026-09-26. Not an affiliate link, we earn nothing from it.











