Grid Pattern Standards
EM Resolutions
£91
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Grid pattern type calibration standards are used to calibrate the magnification, and image distortion of SEMs, FEDEM, FIB, Auger, SIMS and reflected light microscopy applications. Square mesh type grid pattern directly etched in conductive ultra-flat silicon substrate. Available with 1µm or 10µm pitch. Supplied with wafer level certificate of traceability to NIST.
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